BFE in Brief
Mixed Signal ASIC Design
Custom Design : Experience in special applications
- IR detectors / preamplifers / multiplexers
- Micro-power A/D and D/A converters
- X-ray and high energy particle detectors and interface chips
- Radiation hard versions of above
- Image sensors (CMOS and CCD)
- Image processors
- Integrated liquid crystal drivers
Chip Size Extremes
- 300um diameter die size imagers for medical applications
- 17x19 mm^2 display driver for projection displays
- 51x25 mm^2 visible/scintillator x-ray sensor (using stiching)
Speeds and Signals
-
as high speed as 2Ghz analog bandwidth CMOS for LADAR range sensing
-
down to single photon detection
-
from far infrared to high energy particle readout processors
-
1.8V to 22V (or higher) mixed mode CMOS
Device Interfaces
-
on-chip analog, digital, and instruction based interfaces
-
PCB designs and interfaces using FPGA, CPLD, and micro-processor, and analog/digital components
Custom IC Fablication : The right process for each application
note: The "Special" field is used to indicate if a foundry has Stitching or MPW services and/or is ITAR compliant. All units are in um.
| Foundry | Special | 0.13 | 0.18 | 0.25 | 0.35 | Other |
| TSMC | M |
|
|
|
||
| Jazz | S/IT |
|
|
|||
| Tower | S |
|
|
0.5 | ||
| IBM (corp. site) | IT |
|
||||
| Austria MicroSystems |
|
|||||
| AMIS | 0.5/1.2 | |||||
| CSMC | 0.6 | |||||
| Fujitsu |
|
|||||
| HP |
|
0.5 | ||||
| Amkor |
|
0.5 | ||||
| Texas Instruments | 0.8/1 | |||||
| UMC | 0.4(5V) | |||||
Extensive Experience with Multi-Project Wafer (MPW) runs for prototyping
-
MOSIS (California)
-
EUROPRACTICE (Belgium, Germany)
note: Some foundries will provide their own MPW service.
From the over 200 projects BFE has had experiences with a variety of applications, with sensor
readout and display IC's being among the most prominent.
Experience with a variety of Processes
-
CMOS
-
CMOS/CCD
-
Bi-CMOS
-
CMOS-SOS
Custom Testing and System Interface : Performance to your requirements
- Testing the proper parameters
for your application -
prototype to small volume production - Wafer probing and testing at cryogenic temperatures available
- Solutions for system interface
problems:
- Interface electronics
- High density interconnect
- Special packaging
- Optics

